N. Dawley, E. K. Pek, C.-H. Lee, E. J. Ragasa, X. Xiong, K. Lee, S. R. Phillpot, A. V. Chernatynskiy, D. G. Cahill, and D. G. Schlom,  Applied Physics Letters 118, 091904 (2021). https://doi.org/10.1063/5.0037765

Abstract

Unlike many superlattice structures, Ruddlesden–Popper phases have atomically abrupt interfaces useful for interrogating how periodic atomic layers affect thermal properties. Here, we measure the thermal conductivity in thin films of the n¼1–5 and 10 members of the (SrTiO3)nSrO Ruddlesden–Popper superlattices grown by molecular-beam epitaxy and compare the results to a single crystal of the n¼1 Ruddlesden–Popper SrLaAlO4. The thermal conductivity cross-plane to the superlattice layering (k33) is measured using time-domain thermoreflectance as a function of temperature and the results are compared to first-principles calculations. The thermal conductivity of this homologous series decreases with increasing interface density. Characterization by x-ray diffraction and scanning transmission electron microscopy confirms that these samples have a Ruddlesden–Popper superlattice structure.